Publication

  • H. Yamazaki*, Y. Shimizu, K. Tsubota, K. Tahara, S. Shimizu, T. Koyama, H. Yumoto, T. Osaka, I. Inoue, M. Yabashi, and H. Ohashi
    gChannel-cut monochromator withstanding incident powers above 400 W on undulator beamlinesh
    Journal of Synchrotron Radiation 33, 84-90 (2026)

  • Y. Inubushi*, G. Yamaguchi, J. Yamada, Y. Kubota, I. Inoue, T. Osaka, and M. Yabashi
    gSimultaneous lasing of Ni Kƒ¿ and Cu Kƒ¿ lasers from an alloy foil irradiated with an intense X-ray free-electron laser pulseh
    Journal of Synchrotron Radiation 33(2), 508-510 (2026)

  • L. Huang*, R. Xu, T. Wang, J. Yamada, J. Dvorak, C. Austin, A. V. Eeckhout, J. N. Roman, K. Goldberg, and M. Idir
    gFramework for X-ray mirror surface shape fittingh
    Journal of Synchrotron Radiation 33(2), 278-288 (2026)

  • T. Osaka*, S. Matsumura, M. Miyake, Y. Sano, I. Inoue, Y. Inubushi, K. Tono, K. Tamasaku, and M. Yabashi
    gBackground-Free Intensity Autocorrelation for Femtosecond X-Ray Pulsesh
    Physical Review Letters 136, 195002 (2026)

  • Y. Matsumura, S. Iden, D. Toh, J. Yamada, and Y. Sano*
    gDamage-Free Dicing of SiC Substrate Using High-Pressure SF6 Plasma:The Time Dependence of Processed Groove Profilesh
    Materials Science Forum 1193, 41-45 (2026)

  • G. Yamaguchi*, J. Yamada, K. Shioi, T. Osaka, I. Inoue, Y. Inubushi, T. Kameshima, K. Yamauchi, and M. Yabashi
    gSingle-shot full-field X-ray imaging with 10-nm resolution using hard X-ray free-electron laser pulsesh, published
    Nature Photonics 20, 721-726 (2026)

  • K. Kayao, K. Kikkawa, J. Yamada, Y. Sano, K. Yamauchi, and D. Toh*
    gSlurry-free atomic-scale planarization of Si(100) via solid-base-catalyzed etching in pure waterh
    Precision Engineering 102, 186-190 (2026)

  • T. Sato*, D. Zhu, R. Margraf-O'Neal, K. Tamasaku, T. Osaka, H. Osawa, and M. Yabashi
    gVisualization of thermal and strain dynamics in x-ray optics by time-resolved rocking curve imagingh
    Applied Physics Letters 129, 091105 (2026)

bold: authors who belong to Sano Lab., *: corresponding author(s)